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JEOL Electron Microscope

JEOL is a world leader in electron optical equipment and instrumentation for high-end scientific and industrial research and development. Core product groups include electron microscopes (SEMs and TEMs), instruments for the semiconductor industry (electron beam lithography and a series of defect review and inspection tools) and analytical instruments including mass spectrometers, NMRs and ESRs.

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Transmission Electron Microscope (TEM)

CRYO ARM™ 200 (JEM-Z200FSC) Field Emission Cryo-Electron Microscope JEM-ARM300F2 GRAND ARM™2 Atomic Resolution Analytical Microscope JEM-ARM200F NEOARM Atomic Resolution Analytical Electron Microscope.

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JEOL de Mexico > Home

JEOL USA Welcomes New Managing Director, Hidetaka Sawada Wed Apr 21, . JEOL CANADA Names SOQUELEC as Microscopy Sales Representative in Canada Thu Apr 01, . Pristine Sample Preparation for SEM Using Broad Ion Beam Milling Mon Feb 22, . JEOL Introduces New Time-of-Flight Mass Spectrometer JMS-TGC AccuTOF™ GC-Alpha Tue Feb 23, .

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JEOL Transmission Electron Microscope

JEOL JEM-EXII Transmission Electron Microscope is equipped with a ±60° tilting (goniometer) stage, operates at accelerating voltages from 80kV to 200kV, and has a magnification range from 50x to 500,000x. This TEM is capable of selected area diffraction from 100 to 2,500mm.

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JEOL LV SCANNING ELECTRON MICROSCOPE …

THE JEOL LV The JEOL SEM is a sophisticated scanning electron microscope that was designed to operate in either high or low vacuum (the LV connotation indicates the presence of the "low vacuum" controls). The electron column contains a pressure differential aperture that allows the specimen chamber to be operated at a low (or poor).

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SEM: JEOL JSM

 · JEOL JSM-F field-emission SEM The F is a field-emission scanning electron microscope that magnifies up to one million times for visualization and imaging of nanoscale-sized objects. It provides optimal tools for studying the widest possible variety of sample materials:.

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JEOL Ltd

JEOL--a world leader in electron microscopes (SEMs and TEMs), electron beam lithography, defect review and inspection tools) and analytical instruments including mass spectrometers, NMRs and ESRs.

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JEOL NeoScope JCM

The next-generation Scanning Electron Microscope. JEOL NeoScope JCM- SEM. The JCM-'s highly-advanced auto functions, stage automation, and software enable easy sample imaging and elemental analysis for users of all experience levels.

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JEOL Ltd

JEOL--a world leader in electron microscopes (SEMs and TEMs), electron beam lithography, defect review and inspection tools) and analytical instruments including mass spectrometers, NMRs and ESRs.

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JEOL LV SCANNING ELECTRON MICROSCOPE …

THE JEOL LV The JEOL SEM is a sophisticated scanning electron microscope that was designed to operate in either high or low vacuum (the LV connotation indicates the presence of the "low vacuum" controls). The electron column contains a pressure differential aperture that allows the specimen chamber to be operated at a low (or poor).

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Aperture Resolution: JEOL JEM FS: Microscopes

As of July 1, , the 3 OLA apertures in our JEOL FS have diameters of 120, 60 and 40 μm (in positions 1 thru 3). The image to the right shows the effect of these 3 apertures on the electron diffraction pattern from a standard "waffle grid".

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JEOL JEM EXII

The JEOL JEM EXII allows users to perform conventional transmission electron microscopy (TEM) with thin-sectioned specimens, and other transmission electron microscopy with specimens prepared using other methods. Specifications. Resolution: 0.15 nm lattice;.

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JEOL USA

JEOL has played a leading role in the development and evolution of scanning electron microscopes since the early s. JEOL provides valuable applications support, comprehensive training, and award-winning service for the long lifetime of our instruments.

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JEOL JSM

Instrument/ServiceType: Scanning Electron Microscope. Make/ Model: JEOL JSM-. Instrument Description: Performs electron microscopy. It can also be used to do electron beam lithography.

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Scanning Electron Microscope

Scanning Electron Microscope JEOL JSM-. The Scanning Electron Microscope (SEM) consists of an energetically well-defined, highly focused beam of electrons scanned across a sample. The microscope uses a LaB6 source and is pumped usingturbo and ion pumps to maintain the highest possible vacuum.

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Scanning Electron Microscope (SEM)

Serial Block-face SEM JSM-F・F / Gatan 3View®2XP.

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JEOL Transmission Electron Microscope

The JEOL JEM- is a high performance, high contrast, 40-120kV transmission electron microscope with excellent imaging capabilities suitable for biological and materials science applications.

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JEOL F scanning electron microscope

JEOL F scanning electron microscope This Schottky emission gun SEM (1.2 nm resolution at 30kV) is equipped with a conventional Everhart-Thornley secondary detector, a retractalbe DEBEN-BSED-GEN5 backscatter detector, an Oxford Aztec EDS (energy-dispersive spectrometer) and EBSD (electron backscatter diffraction) system. Contact: Boquan Li.

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JEOL 100CX II transmission electron microscope (TEM) 100kV

 · Operating Instructions Initial conditions: DP light is on, HIGH VACUUM light is on.; Ready indicator light is on.; Objective aperture is out. SAD aperture is out. Accel Voltage is off (HT button is out). Specimen holder is inserted into the goniometer (opening for sample).

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JEOL Ltd

JEOL--a world leader in electron microscopes (SEMs and TEMs), electron beam lithography, defect review and inspection tools) and analytical instruments including mass spectrometers, NMRs and ESRs.

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JEOL F Transmission Electron Microscope (TEM)

Electron Microscopy Transmission Electron Microscopy (TEM) Information the Equipment Can Provide. The JEOL F is a high-resolution transmission electron microscope. Key Features. Lattice Imaging (HRTEM) Elemental identification and mapping (EDXS and EELS) Electronic state identification and mapping (EELS).

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Jeol JEM

Jeol JEM- Transmission Electron Microscope The JEM- is a high throughput nano-analysis TEM with automated functions Operation Modes: • TEM • STEM • SEM imaging capabilities Electron Gun • Schottky-Type Electron Gun • Accelerating voltage: 100kV-200kV EDX • Energy-Dispersive X-ray Spectrometer • Dual Detector STEM Features.

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JEOL JEM EXII

The JEOL JEM EXII allows users to perform conventional transmission electron microscopy (TEM) with thin-sectioned specimens, and other transmission electron microscopy with specimens prepared using other methods. Specifications. Resolution: 0.15 nm lattice;.

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